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US Patent Issued to SEIKO EPSON on July 14 for "Physical quantity sensor and inertial measurement unit" (Japanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,040, issued on July 14, was assigned to SEIKO EPSON Corp. (Japan). "Physical quantity sensor and inertial measurement unit" was invented by... और पढ़ें


US Patent Issued to Enplas on July 14 for "Socket and inspection socket" (Singaporean, Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,041, issued on July 14, was assigned to Enplas Corp. (Saitama, Japan). "Socket and inspection socket" was invented by Rui Zhi Law (Singapor... और पढ़ें


US Patent Issued to XINGR TECHNOLOGIES (ZHEJIANG) on July 14 for "Socket assembly" (Singaporean, Taiwanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,042, issued on July 14, was assigned to XINGR TECHNOLOGIES (ZHEJIANG) Ltd. (Yiwu City, China). "Socket assembly" was invented by Choon Leon... और पढ़ें


US Patent Issued to POINT ENGINEERING on July 14 for "Electrically conductive contact pin" (South Korean Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,043, issued on July 14, was assigned to POINT ENGINEERING Co. LTD. (Chungcheongnam-do, South Korea). "Electrically conductive contact pin" ... और पढ़ें


US Patent Issued to JF MICROTECHNOLOGY SDN. BHD. on July 14 for "Spring contact in a testing apparatus for integrated circuits" (Malaysian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,044, issued on July 14, was assigned to JF MICROTECHNOLOGY SDN. BHD. (Petaling Jaya, Malaysia). "Spring contact in a testing apparatus for ... और पढ़ें


US Patent Issued to STAR TECHNOLOGIES on July 14 for "Probe card, and supporting structure and probe structure thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,045, issued on July 14, was assigned to STAR TECHNOLOGIES INC. (Hsinchu City, Taiwan). "Probe card, and supporting structure and probe stru... और पढ़ें


US Patent Issued to JAPAN ELECTRONIC MATERIALS on July 14 for "Probe passing method and probe" (Japanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,046, issued on July 14, was assigned to JAPAN ELECTRONIC MATERIALS Corp. (Hyogo, Japan). "Probe passing method and probe" was invented by A... और पढ़ें


US Patent Issued to JAPAN ELECTRONIC MATERIALS on July 14 for "Composite probe, method for attaching probe, and method for manufacturing probe card" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,047, issued on July 14, was assigned to JAPAN ELECTRONIC MATERIALS Corp. (Hyogo, Japan). "Composite probe, method for attaching probe, and ... और पढ़ें


US Patent Issued on July 14 for "Method and system for testing high-voltage ride-through of photovoltaic inverter" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,048, issued on July 14. "Method and system for testing high-voltage ride-through of photovoltaic inverter" was invented by Chenhui Niu (Nan... और पढ़ें


US Patent Issued to Ark HDPS Semiconductor Pte. Ltd. on July 14 for "Current detection circuit and method for improving accuracy of inductor current detection" (Taiwanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,049, issued on July 14, was assigned to Ark HDPS Semiconductor Pte. Ltd. (Singapore). "Current detection circuit and method for improving a... और पढ़ें